首页> 外文OA文献 >Structural, magnetic, and nanoscale switching properties of BiFeO3 thin films grown by pulsed electron deposition
【2h】

Structural, magnetic, and nanoscale switching properties of BiFeO3 thin films grown by pulsed electron deposition

机译:BiFeO3薄的结构,磁性和纳米级开关特性   通过脉冲电子沉积生长的薄膜

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

We report the epitaxial growth of BiFeO3 by pulsed electron deposition andthe resulting crystal quality, magnetic and nanoscale switching properties.X-ray diffraction shows high quality single phase, epitaxial (001) orientedfilms grown on SrTiO3 (001) substrates. Both field and temperature dependentmagnetic properties reveal an antiferromagnetic behavior of the films. For thefilm with a SrRuO3 bottom electrode, an exchange-enhancement effect betweenantiferromagnetic BiFeO3 and ferromagnetic SrRuO3 was observed at lowtemperature. The piezoelectric force microscopy and switching spectroscopymeasurements demonstrate the local domain switching process and suggest thatthe BiFeO3 films are high quality ferroelectrics.
机译:我们报道了通过脉冲电子沉积BiFeO3的外延生长及其所产生的晶体质量,磁性和纳米级开关特性。X射线衍射显示在SrTiO3(001)衬底上生长的高质量单相外延(001)取向膜。场和温度相关的磁性都揭示了膜的反铁磁行为。对于具有SrRuO3底部电极的薄膜,在低温下观察到反磁性BiFeO3和铁磁性SrRuO3之间的交换增强作用。压电力显微镜和开关光谱法的测量结果表明了局域开关过程,并表明BiFeO3薄膜是高质量的铁电体。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号